Research Interests:
Nanotechnology, materials science of thin films, magnetic materials, nano-tribology. Magnetic switching of nanoparticles. Giant-magneto resisitance and Giant-magnetoimpedence in thin films
Degrees:
Ph.D. Materials Science, Massachusetts Institute of Technology, 1989.
M.S. Physics, Northeastern University, 1985.
B.S. Mechanical Eng. Tech. , Florida International University, 1979.
B.A. Physics, New College of Florida, 1975.
Recent Publications:
“Characterization of Pt–Ru Binary Alloy Thin Films for Work Function Tuning,” R. M. Todi, K. B. Sundaram, K. R. Coffey, IEEE Electron Device Letters, Vol. 27, Issue 7, pages 542-545, 2006
"X-ray photoelectron spectroscopy analysis of oxygen annealed radio frequency sputter deposited SiCN thin films," R. M. Todi, K. B. Sundaram, K. R. Coffey, Journal of the Electrochemical Society, Vol. 153, issue 7, pages G640-G643, 2006
"Compositional stability of FePt nanoparticles on SiO2/Si during annealing", B. Yao, R. V. Petrova, R. R. Vanfleet, V. Lam, and K.R. Coffey, Journal of Applied Physics, Vol. 99, Issue 8, Article No. 08E913, 2006.
“Characterization of Individual L10 FePt Nanoparticles," R. V. Petrova, R. R. Vanfleet, D. Richardson, B. Yao, and K. R. Coffey, IEEE Transactions on Magnetics, vol. 41, Issue 10, pages 3202-3204, 2005.
“On the relationship of magnetocrystalline anisotropy and stoichiometry in epitaxial L1(0) CoPt (001) and FePt (001) thin films,” K. Barmak, J. Kim, K. R. Coffey, M. F. Toney, A. J. Kellock, J.-U. Thiele, Journal of Applied Physics, Vol. 98, Issue 3, Article 033904, Aug. 2005.
“Comparison of the agglomeration behavior of thin metallic films on SiO2,” P. R. Gadkari, A. P. Warren, R. M. Todi, R. V. Petrova, and K. R. Coffey, Journal of Vacuum Science and Technology A, Vol. 23, Issue 4, pp. 1152-1161, Jul.-Aug. 2005.
“Growth and characterization of sputtered BSTO/BaM multilayers,” S. Srinath, N. A. Frey, R. Heindl, H. Srikanth, K. R. Coffey, and N. J. Dudney, Journal of Applied Physics, Vol. 97, Issue 10, Article 10J115, May 2005.
“Temperature dependence of the magnetization reversal of thin film longitudinal magnetic recording media,” K.R. Coffey, J.-U. Thiele, and T. Thomson, IEEE Transactions on Magnetics, Vol. 40, Issue 4, pp. 2440-2442, July 2004.
“Stoichiometry-anisotropy connections in epitaxial FePt(001) films,” K. Barmak, J. Kim, L. H. Lewis, K. R. Coffey, M. F. Toney, A. J. Kellock, and J.-U. Thiele, Journal of Applied Physics, Vol. 95, Issue 11, part 2, pp. 7501-7503, June 2004
“Angle dependent magnetization reversal of thin film magnetic recording media,” K. R. Coffey, T. Thomson, and J.-U. Thiele, Journal of Applied Physics, Vol. 93, Issue 10, pp. 8471-8473, May 2003.
